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smartlab se x ray diffractometer  (Rigaku Corporation)


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    Rigaku Corporation smartlab se x ray diffractometer
    <t>(a)</t> <t>X-ray</t> diffraction (XRD) patterns and (b) Fourier-transform infrared (FT-IR) spectra of whole quinoa flour samples subjected to different dry-heat treatment (DHT) temperatures. Characteristic diffraction peaks at 2θ ≈ 15°, 17°, 18°, and 23° indicate a typical A-type crystalline structure and the major FT-IR absorption regions (amide I band at 1700–1600 cm −1 and carbohydrate backbone at 1060–960 cm −1 ). Control, untreated quinoa flour; 110, 130, and 150 denote quinoa flour treated at 110 °C, 130 °C, and 150 °C for 1 h, respectively.
    Smartlab Se X Ray Diffractometer, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 6621 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/x-ray+smartlab+se+diffractometer/SmartLab+SE/pmc13563555-84-7-11
    Average 99 stars, based on 6621 article reviews
    smartlab se x ray diffractometer - by Bioz Stars, 2026-10
    99/100 stars

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    1) Product Images from "From raw material to functional food: Effect of dry-heat treatment on whole quinoa flour structure and dough rheology, with in vivo hypoglycemic validation at the optimal temperature"

    Article Title: From raw material to functional food: Effect of dry-heat treatment on whole quinoa flour structure and dough rheology, with in vivo hypoglycemic validation at the optimal temperature

    Journal: Food Chemistry: X

    doi: 10.1016/j.fochx.2026.104360

    (a) X-ray diffraction (XRD) patterns and (b) Fourier-transform infrared (FT-IR) spectra of whole quinoa flour samples subjected to different dry-heat treatment (DHT) temperatures. Characteristic diffraction peaks at 2θ ≈ 15°, 17°, 18°, and 23° indicate a typical A-type crystalline structure and the major FT-IR absorption regions (amide I band at 1700–1600 cm −1 and carbohydrate backbone at 1060–960 cm −1 ). Control, untreated quinoa flour; 110, 130, and 150 denote quinoa flour treated at 110 °C, 130 °C, and 150 °C for 1 h, respectively.
    Figure Legend Snippet: (a) X-ray diffraction (XRD) patterns and (b) Fourier-transform infrared (FT-IR) spectra of whole quinoa flour samples subjected to different dry-heat treatment (DHT) temperatures. Characteristic diffraction peaks at 2θ ≈ 15°, 17°, 18°, and 23° indicate a typical A-type crystalline structure and the major FT-IR absorption regions (amide I band at 1700–1600 cm −1 and carbohydrate backbone at 1060–960 cm −1 ). Control, untreated quinoa flour; 110, 130, and 150 denote quinoa flour treated at 110 °C, 130 °C, and 150 °C for 1 h, respectively.

    Techniques Used: Fourier Transform Infrared Spectroscopy, Control

    Related Articles

    other:

    Article Title: Heterometallic Molecular and Ionic Isomers.
    Article Snippet: X-ray powder diffraction data were collected on a Rigaku multipurpose θθ X-ray SmartLab SE diffractometer (Cu Kα radiation, HyPix-400 two-dimensional advanced photon counting hybrid pixel array detector, step of 0.01° 2θ, 20 °C).



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    Image Search Results


    (a) X-ray diffraction (XRD) patterns and (b) Fourier-transform infrared (FT-IR) spectra of whole quinoa flour samples subjected to different dry-heat treatment (DHT) temperatures. Characteristic diffraction peaks at 2θ ≈ 15°, 17°, 18°, and 23° indicate a typical A-type crystalline structure and the major FT-IR absorption regions (amide I band at 1700–1600 cm −1 and carbohydrate backbone at 1060–960 cm −1 ). Control, untreated quinoa flour; 110, 130, and 150 denote quinoa flour treated at 110 °C, 130 °C, and 150 °C for 1 h, respectively.

    Journal: Food Chemistry: X

    Article Title: From raw material to functional food: Effect of dry-heat treatment on whole quinoa flour structure and dough rheology, with in vivo hypoglycemic validation at the optimal temperature

    doi: 10.1016/j.fochx.2026.104360

    Figure Lengend Snippet: (a) X-ray diffraction (XRD) patterns and (b) Fourier-transform infrared (FT-IR) spectra of whole quinoa flour samples subjected to different dry-heat treatment (DHT) temperatures. Characteristic diffraction peaks at 2θ ≈ 15°, 17°, 18°, and 23° indicate a typical A-type crystalline structure and the major FT-IR absorption regions (amide I band at 1700–1600 cm −1 and carbohydrate backbone at 1060–960 cm −1 ). Control, untreated quinoa flour; 110, 130, and 150 denote quinoa flour treated at 110 °C, 130 °C, and 150 °C for 1 h, respectively.

    Article Snippet: X-ray diffraction patterns were obtained using a Smartlab SE X-ray diffractometer (Rigaku, Japan) operated in step-scan mode.

    Techniques: Fourier Transform Infrared Spectroscopy, Control

    Characterization of the synthesized ZnO-NPs: ( A ) UV–Vis absorption spectrum; ( B ) FTIR spectrum; ( C ) X-ray diffraction (XRD) pattern; and ( D ) transmission electron microscopy (TEM) micrographs.

    Journal: Biomolecules

    Article Title: Silymarin and Zinc Oxide Nanoparticles Attenuate Experimental Colon Cancer in Rats Through Crosstalk of miR-192 and β-Catenin Pathways

    doi: 10.3390/biom16091374

    Figure Lengend Snippet: Characterization of the synthesized ZnO-NPs: ( A ) UV–Vis absorption spectrum; ( B ) FTIR spectrum; ( C ) X-ray diffraction (XRD) pattern; and ( D ) transmission electron microscopy (TEM) micrographs.

    Article Snippet: A standard X-ray diffractometer (SmartLab SE, Rigaku, Tokyo, Japan) using Cu-Kα radiation (λ = 1.54 Å) was used to identify the crystalline form and phase structure of the powdered ZnO-NPs.

    Techniques: Synthesized, Transmission Assay, Electron Microscopy